Sciaps Z-200 C+ XRF Analyzer is a dedicated analyzer for alloy analysis including carbon content. It analyzes carbon content in stainless, down to 0.007 percent, for dependable separation of L and H grades. The C+ also analyzes carbon steels, including carbon equivalents (CE) for weldability.
Sciaps Z-200 C+ XRF Analyzer is available in two versions. Comes with iron-base calibrations including carbon. The Z-200 C+ includes both iron and stainless bases and carbon. Sciaps Z-200 C+ XRF Analyzer additional bases may be added at time of purchase or any later date. Following in the tradition of our defy-obsolescence principle, any Z-200 or Z-200 C may be upgraded to the Z-200 C+ at any time for the price difference.
Sciaps Z-200 C+ XRF Analyzer Features:
- Non destructive Testing (NDT)
- PMI ( Positif Material Identification)
- FAC (Flow Accelerated Corrosion)
- Corrosion
- Sulfidation
- Residual and Traces Elements
Sciaps Z-200 C+ XRF Analyzer Included:
- Hard Transport Case
- 2 Lithium Ion Batteries
- Smart Charging System
- Cartridges
- Data Cable
You may also be interested in SciAps X-550 XRF Analyzer
Sciaps Z-200 C+ XRF Analyzer Specifications:
Weight | 4 lbs with battery |
Dimensions | 8.25″ x 11.5″ x 4.5″ |
Display | 5″ color touchscreen Smartphone type display – PowerVR SGX540 3D graphic |
Sample viewing | On-board camera/video for viewing sample before, during analysis, laser spot finder to show where laser strikes sample. |
Auto-focus | Z-direction stage, computer controlled for manually or automatically adjusting laser focus location on sample. Essential for liquids analysis. |
Comms/Data Transfer | Wifi, Bluetooth, USB. Connectivity to most devices, including SciAps Profile Builder PC software. |
Available Apps | Alloy, Geochem (Mining), Empirical, Environmental Apps. New Apps are added regularly please check with company or website. |
Excitation Source | 5-6 mJ/pulse, 50 Hz repetition rate, 1064 nm laser source |
Processing Electronics | ARM Cortex -A9 dual-core / 1.2 GHz Memory: 1 GB DDR2 RAM, 1 GB NAND |
Spectral Data Acquisition | Spectral data collected in either ungated or gated operation, with user settable gate delays |
Laser Raster | On-board XY stage for rastering laser to discrete locations for targeted analysis or averaging. Raster pattern up to 16 x 16 grid, 256 locations. |
Calibration Check | Internal shutter is also 316 stainless for totally automated calibration and wavelength scale validation. |
Power | On board rechargeable Li-ion battery, rechargeable inside device or with external charger, AC power. |
Drift Correction | Only needed for higher accuracy analysis (argon purge). Automated drift correction using factory provided or user provided reference materials. |
Grade library (alloy) | 500+ grades, multiple libraries supported, grades may be added on analyzer or via PC software package (ProfileBuilder). |
Data Storage | Results Storage: 8 GB SD |
Security | Password protected usage (user level) and internal settings (admin). |
Regulatory | CE, RoHS, USFDA registered. Class 3b laser. Sample sensor on-board, allows for operation under Class 1 conditions, subject to local LSO approval. CE, RoHS, USFDA registered. |
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